Electrical Testing-Product Center-Congtical Technology

Temperature-Dependent Resistivity Measurement System

The variable-temperature resistivity measurement system (RMS) employs the four-probe method and is capable of determining the electrical resistivity of materials. It can measure the resistivity of bulk semiconductor samples, semimetallic materials (such as constantan, nickel, bismuth, etc.), and certain nonmetallic materials (including graphite and carbon-based materials). This system finds extensive application in temperature control, thermoelectric power generation, cooling of electronic devices (e.g., infrared and far-infrared detectors, high-speed chips), medical equipment, high‑temperature superconductivity, as well as air-conditioning systems for spacecraft and submarines, among many other critical fields.

Dielectric Temperature Spectrum Measurement System

The variable-temperature dielectric testing system is a measurement platform designed to investigate the dielectric properties of materials. Dielectrics are insulating materials that can be polarized under an electric field, and their dielectric performance is typically characterized by the relative permittivity and dielectric loss. To assess the thermal stability of dielectric properties, it is often necessary to measure how dielectric parameters—such as relative permittivity and dielectric loss—vary with temperature over a specified range. This is particularly important for piezoelectric and ferroelectric materials, where temperature‑dependent dielectric behavior plays a crucial role in both theoretical research and practical applications.

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