Dielectric Temperature Spectrum Measurement System

The variable-temperature dielectric testing system is a measurement platform designed to investigate the dielectric properties of materials. Dielectrics are insulating materials that can be polarized under an electric field, and their dielectric performance is typically characterized by the relative permittivity and dielectric loss. To assess the thermal stability of dielectric properties, it is often necessary to measure how dielectric parameters—such as relative permittivity and dielectric loss—vary with temperature over a specified range. This is particularly important for piezoelectric and ferroelectric materials, where temperature‑dependent dielectric behavior plays a crucial role in both theoretical research and practical applications.

Technical Specifications Product Features Download Materials

Type	Project	Technical Specifications
Test parameters	Test physical quantity	Continuous Acquisition of Relative Dielectric (Performance) Parameters During Temperature Variation
	Sample Requirements	5mm ≤ D≤ 20mm; 0.5≤t≤ 2.5mm (Applicable to circular, block-shaped samples with electrodes)
	Frequency range	Depends on the measuring instrument.
Temperature control parameters	Temperature range	80K-800K
	Temperature control accuracy	0.1℃
	Display precision	0.5℃
	Heating method	Heating rod heating
	Cooling method	Liquid nitrogen cooling
	Heating rate	(1–30) K/min program control
	Cooling rate	(1–20) K/min program control
	Maximum heating power	100W
System parameters	Collection Control Box Dimensions	366mm(W)360mm(D)160mm (H)
	Test device dimensions	140m120mm180mm
	Rated voltage	220V/50HZ
	Total machine power	250W
Other parameters	Enclosure cooling method	Natural cooling or air cooling
	Maximum enclosure temperature	40℃
	Test atmosphere	Vacuum
	Vacuum level	≤1Pa
	Vacuum volume	2L

1. The temperature‑control range is broad, spanning from −196 °C to 600 °C, with controllable heating and cooling rates throughout the process.

2. Compatible with a variety of dielectric (property) analyzers; the test frequency can be selected according to the specific measurement requirements by using different instruments.

3. The test data set is large and complete, with continuous data acquisition during the temperature‑varying process, and the sampling duration can be freely selected. During a single temperature sweep, multiple frequencies can be acquired simultaneously, resulting in high testing efficiency.
4. The equipment is compact, easy to operate, and simple to maintain.
5. Measurement results are stable, and the data is smooth.