Electrical Measurement Heating and Cooling Stage-Product Center-Congtical Technology

Front-Probe High-Temperature Hot Stage

It employs high-temperature heating elements, enabling long-term stable operation at 1200°C; it uses high-temperature ceramic‑based probe arms to ensure probe stability and reliability under elevated temperatures; an additional temperature signal channel can be added for integration with other test software.

Front-Probe Heating and Cooling Stage

Suitable for situations where the test probe needs to make contact with the front side of the sample, this probe features both forward/retractable movement and free rotation, making it flexible and convenient to use. Depending on the contact conditions between the probe and the sample, probes of different materials and tip shapes can be selected. Accessories include: A2505 (optical table square‑cavity mount), A2801 (beryllium‑copper probe), A2802 (high‑temperature alloy probe), and A2803 (tungsten carbide probe).

Back-Probe Heating and Cooling Stage

Suitable for cases where the electrode is positioned on the back side of the sample, the probe can withstand high and low temperature environments and is designed for repeated use. The upper observation window is located at a considerable distance from the sample, eliminating the need for gas purging to prevent condensation on the window surface. An external terminal box is provided for signal switching, and when paired with an external humidity‑control module, it is ideal for temperature‑dependent testing and analysis of perovskites, solar cells, OLEDs, and other materials.

High-Low Temperature Displacement Probe Station

The Congtical Technology OE-series probe station is available in two cooling configurations—liquid nitrogen cooling and GM cryocooler—and offers a controllable temperature range from −260°C to 600°C. The system supports DC signals as low as 1 pA, high-frequency signals up to 50 GHz, and high-voltage signals up to 1 kV. Microscopes, probes, and temperature‑controlled modules can be interchanged as needed, and the platform comes with advanced material‑property measurement software that includes optoelectronic and thermoelectric testing capabilities. It is widely used in semiconductor manufacturing, MEMS, superconductivity, electronics, physics, and materials science, enabling standard I–V, C–V, microwave, and optoelectronic experiments.

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