Temperature-Dependent Resistivity Measurement System

The variable-temperature resistivity measurement system (RMS) employs the four-probe method and is capable of determining the electrical resistivity of materials. It can measure the resistivity of bulk semiconductor samples, semimetallic materials (such as constantan, nickel, bismuth, etc.), and certain nonmetallic materials (including graphite and carbon-based materials). This system finds extensive application in temperature control, thermoelectric power generation, cooling of electronic devices (e.g., infrared and far-infrared detectors, high-speed chips), medical equipment, high‑temperature superconductivity, as well as air-conditioning systems for spacecraft and submarines, among many other critical fields.

Technical Specifications Product Features Download Materials

Parameter type	Project	Technical Specifications
Basic Parameters	Model number	RMS-600	RMS-1200
	Appearance dimensions	140m120mm42mm
	Sample stage material	Sterling silver	Aluminum oxide ceramic
	Sample stage size	30mm*20mm	Φ16mm
	Cavity net weight	1kg
	Vacuum level	≤1Pa
Temperature parameter	Temperature range	-190℃ to 600℃	RT to 1200℃
	Temperature resolution	0.1℃
	Temperature control accuracy	±0.1℃
	Maximum heating rate	50℃/min	100℃/min
	Maximum cooling rate	-25℃/min	Natural cooling
	Heating element	Heating rod	Platinum wire heater
	Temperature sensor	Platinum resistance thermometer	Type S thermocouple
Electrical parameters	Probe Type	Fixed probe (with adjustable tip position and angle)
	Adjustment method	Manual adjustment
	Probe material	Tungsten steel or beryllium copper
	Number of probes	4 pieces
Optical parameters	Number of observation windows	1
	Front observation window size	Φ41mm		Φ32mm
	Window pane material	Quartz
System Parameters	Control box dimensions	350mm350mm150mm
	Electrical Requirements	220V/50Hz
	Temperature control algorithm	Two-degree-of-freedom PID
	Human-computer interaction	WinTemp-RMS
	Total machine power	200W			400W
Resistivity Test Parameters	Resistivity measurement error	≤10%
	Repeatability test error	≤3%
	Resistivity measurement range	1e-8 Ω to 1.2e+9 Ω
	Sample Size Requirements	L≥10mm W≤4mm T≥50nm (Applicable to bulk, flake, filamentary, and film samples with a substrate)

1. It offers a wide temperature‑control range, covering the full span from −190°C to 1200°C, with controllable heating and cooling rates during temperature transitions.

2. High test accuracy and wide measurement range: resistance measurement spans from 1e-8 Ω to 1.2e+9 Ω.

3. The test dataset is large and complete, with continuous data acquisition during the temperature‑varying process; resistivity measurements are recorded twice per second.