Project Case | On-site Testing of Pian‑grade Current Test Probes on a Thermal‑Cycling Stage

Category: Semiconductor

Release date: 2024-01-31

Summary: Wuhan Congtical Technology Co., Ltd. specializes in the field of thermal analysis and offers a range of patented products, including probe‑based hot/cold stages, spectrometer‑compatible hot/cold stages, microscope‑mounted hot/cold stages, in‑situ tensile/compressive hot/cold stages, and heating plates, as well as testing systems for variable‑temperature resistance, dielectric thermal spectroscopy, and Hall‑effect measurements.

 

Wuhan Congtical Technology Co., Ltd. specializes in the field of thermal analysis and offers a range of patented products, including probe‑based hot/cold stages, spectrometer‑compatible hot/cold stages, microscope‑mounted hot/cold stages, in‑situ tensile/compressive hot/cold stages, and heating plates, as well as testing systems for variable‑temperature resistance, dielectric thermal spectroscopy, and Hall‑effect measurements.

 

Recently, in response to customer requirements, Wuhan Chongguang customized a picoampere‑level current‑testing thermal‑cycling stage for on‑site testing. The Wuhan Chongguang picoampere‑level current probe thermal‑cycling stage is specifically designed to evaluate the electrical performance of electronic components under varying temperature conditions, enabling characterization of how their electrical properties evolve with temperature during heating and cooling cycles.

 

The Wuhan Chongguang custom picoampere‑level current probe cryo‑thermal stage features two types of probes: a spring‑loaded, rounded‑tip probe at the base, suitable for measuring current passing through the sample, and a sharp‑tip probe with an adjustable probe arm, designed to measure picoampere‑level leakage currents when the sample is energized. This customized cryo‑thermal stage employs liquid nitrogen cooling, resistive heating, and vacuum insulation to achieve precise temperature control within the range of −190 to 300°C. It can be integrated with electrical instruments, such as source meters, to perform temperature‑dependent electrical property measurements.

Figure 1: Chongguang Customized Pi’an‑Grade Current Test Probe Cold/Hot Stage
 

I. Main Technical Parameters of the Product:

1. Cooling and heating method: liquid nitrogen cooling, resistive heating

2. Temperature control range: -100~200℃

3. Temperature stability: ±0.1℃

4. Temperature resolution: 0.1℃

5. Vacuum level: ≤0.1 Pa

6. Probes: one set of round‑head spring probes, one set of adjustable‑tip probes

7. Stage dimensions: 40 mm × 60 mm

8. Stage material: silver substrate with an additional ceramic insulating layer.

 

9. Current resolution: 1 pA

 

 

II. Photos from the Testing Site

Figure 2: An engineer adjusting the probe’s distance and pressure.

Figure 3: Observation of the contact between the sample and the probe

Figure 4. Current of the test sample under temperature variation

Keywords: Project Case | On-site Testing of Pian‑grade Current Test Probes on a Thermal‑Cycling Stage

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Products suitable for this type of application

Front-Probe Heating and Cooling Stage

Front-Probe Heating and Cooling Stage

TS600S-OE, TES120S-OE

Suitable for situations where the test probe needs to make contact with the front side of the sample, this probe features both forward/retractable movement and free rotation, making it flexible and convenient to use. Depending on the contact conditions between the probe and the sample, probes of different materials and tip shapes can be selected. Accessories include: A2505 (optical table square‑cavity mount), A2801 (beryllium‑copper probe), A2802 (high‑temperature alloy probe), and A2803 (tungsten carbide probe).
The test probe is retractable and freely rotatable, making it flexible and convenient to use.
Depending on the contact conditions between the probe and the sample, probes of different materials and contact tip shapes can be selected.

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