High-Low Temperature Hall Effect Measurement System

Semiconductor Materials Research: By investigating electron mobility and carrier concentration, this research elucidates the temperature-dependent behavior of semiconductor materials and the mechanisms underlying scattering. The focus is primarily on semiconductor wafer fabrication processes and applications such as solar cells. Magnetic Materials Research: Studies of the Hall effect and magnetoresistance provide critical support for advancements in magnetic storage, magnetic sensors, and related fields. Furthermore, for certain spintronic materials, variable-temperature Hall-effect measurements help explore the potential applications of novel spintronic devices.
Technical Specifications Product Features Download Materials

Parameter type

Project

Technical Specifications

Hot and Cold Stage Parameters

Model number

RMS-600

RMS-1200

Cold/Hot Stage Dimensions

140mm*120mm*42mm

Sample area

30mm*30mm

φ22mm

Sample Requirements

L≥10mm;W≥3mm;T≥50mm
(Applicable to bulk, flake, filamentary, and film samples with a substrate)

Sample types

Graphite, ITO

Thermostat parameters

Temperature range

-196℃~600℃

RT~1200℃

Temperature control accuracy

0.1℃

Display precision

0.1℃

Heating method

Heating rod heating

Cooling method

Liquid nitrogen cooling

-

Temperature sensor

Thermocouple

Type S thermocouple

Heating rate

1–50°C/min, programmable control

1–100°C/min, programmable control

Cooling rate

1–40°C/min, programmable control

Natural cooling

Temperature control box dimensions

350mm(W)*350mm(D)*150mm(H)

Temperature control algorithm

Intelligent PID algorithm (with auto-tuning capability)

Editable Curve

Up to 40 segments can be edited.

Human-computer interaction

Button + Code‑breaking screen

Other parameters

Test physical quantity

Continuous resistivity measurements during the temperature‑varying process.

Resistivity measurement error

≤10%

Repeatability error

≤3%

Resistance measurement range

1 µΩ - 1 GΩ

Vacuum level

≤1Pa

Vacuum volume

2L

Test atmosphere

Vacuum

Maximum enclosure temperature

40℃

Enclosure cooling method

Natural cooling or water cooling

1. Fast temperature‑change rate: Supports rapid switching between current and magnetic field directions, with data processing performed using the Van der Pauw method, setting a benchmark among comparable products on the market.

2. High-precision measurement: Temperature control accuracy as high as ±0.1°C, with ±0.3°C across the entire temperature range.

3. High uniformity: deviation no greater than 1%;

4. Automated Control Function: Testing can be performed via the touchscreen and the host computer; the software interface is clean, intuitive, and easy to use.

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