[New Product Launch] The Chongguang Ultra-Low-Temperature Displacement Probe Station Has Been Successfully Developed!

Category: News activities

Release date: 2025-05-22

Summary: As quantum computing surges past a critical threshold, third‑generation semiconductor materials accelerate toward commercialization, and superconducting technologies enter the phase of engineering‑scale validation, cutting‑edge fields such as the semiconductor industry, MEMS microsystems, and condensed matter physics are confronting unprecedented challenges in precision measurement and control: How can we detect nanovolt‑level electrical signals in ultra‑cold environments approaching absolute zero while achieving distortion‑free transmission of 50 GHz high‑frequency signals? With material‑level characterization now entering an era of “extreme conditions,” a measurement instrument capable of transcending temperature limits and signal‑integrity barriers has become an essential enabler for both scientific research and industrial upgrading.

As quantum computing surges past a critical threshold, third‑generation semiconductor materials accelerate toward commercialization, and superconducting technologies enter the phase of engineering‑scale validation, cutting‑edge fields such as the semiconductor industry, MEMS microsystems, and condensed matter physics are confronting unprecedented challenges in precision measurement and control: How can we detect nanovolt‑level electrical signals in ultra‑cold environments approaching absolute zero while achieving distortion‑free transmission of 50 GHz high‑frequency signals? With material‑level characterization now entering an era of “extreme conditions,” a measurement instrument capable of transcending temperature limits and signal‑integrity barriers has become an essential requirement for both scientific research and industrial upgrading.

Born out of the mission to drive technological innovation, the ultra‑low‑temperature scanning probe microscope has emerged, leveraging GM cryocooler technology as its core to establish a full‑temperature‑range measurement and control platform spanning from 6 K to 320 K. Paired with a multimodal signal‑compatible system and a modular measurement architecture, it delivers groundbreaking solutions for materials characterization and device testing in extreme environments.

 

01. Advanced refrigeration technology, covering an ultra-wide temperature range.

The ultra-low‑temperature cryogenic probe station employs an advanced GM‑type refrigeration system, enabling precise temperature control across an exceptionally broad range—from 6 K to 302 K. Whether operating in near‑absolute‑zero conditions or at temperatures above room temperature, it delivers stable performance, providing accurate thermal regulation for your experiments. This capability allows it to meet the demanding requirements of characterizing material properties under extreme thermal conditions, particularly in studies of the critical transition temperatures of superconducting materials.

Ultra-low-temperature displacement probe station

 

Model number GM-6K-OE
Cooling method GM refrigerator
Temperature range 6K-320K
Display precision 0.001K
Temperature control accuracy ±0.01 K
Maximum heating rate 20K/min
Maximum cooling rate 10K/2h
Sample stage size φ40mm
Front observation window size φ41mm (single-sided)
Appearance dimensions 450*450*1000mm
Cavity net weight 90kg
Probe Type DC or high-frequency displacement probe
Adjustment method Displacement knob adjustment
Probe material Tungsten carbide or beryllium copper (tip diameter 1 µm), or a 50 g high-frequency probe, or a DC probe.
Number of probes 4 or 6
Current parameters pA grade

 

02. Exceptional signal compatibility, capable of handling complex measurements.

In signal measurement, this probe station delivers equally outstanding performance. It supports DC signals as low as 1 pA, high‑frequency signals up to 50 GHz, and high‑voltage signals of 1 kV, enabling precise measurements of multiple signal types on a single platform. This eliminates the need for frequent instrument changes, significantly boosting experimental efficiency while reducing equipment costs. Whether it’s detecting ultra‑weak current signals, analyzing high‑frequency microwave signals, or testing electrical performance under high‑voltage conditions, it accurately captures signal details and provides you with reliable data.

 

03. Flexible module switching expands measurement capabilities.

Microscope, probe, temperature‑controlled, and other modules can be switched on the fly to suit your experimental needs, making your experimental design more flexible and versatile. The instrument also comes equipped with an advanced material‑properties measurement software that offers a wide range of testing capabilities, including optoelectronic and thermal measurements. With straightforward操作, you can easily toggle between different test modes, enabling comprehensive characterization spanning electrical, optical, and thermal properties. Featuring a user‑friendly interface and robust functionality, the software supports real‑time data acquisition, processing, and analysis, providing powerful computational support for your research.


 

04 Wide-ranging applications, driving the development of multiple industries

Thanks to its outstanding performance, the ultra‑low‑temperature displacement probe station is widely used in numerous fields, including the semiconductor industry, MEMS, superconductivity, electronics, physics, and materials science. In the semiconductor industry, it supports standard IV and CV measurements, helping engineers evaluate device performance; in the MEMS domain, it enables precise displacement and mechanical‑property characterization of microelectromechanical systems; in superconductivity research, it provides critical data for characterizing material properties; and in electronics, physics, and materials science, it facilitates a range of experiments—such as microwave and optoelectronic studies—thereby empowering researchers to explore uncharted scientific frontiers.


 

05. Choose an ultra-low-temperature displacement probe station and embark on a new journey of precision measurement.

Whether you are a researcher at a scientific institution or an engineer in an industrial enterprise, the cryogenic displacement probe station will be your ideal measurement partner. With its cutting-edge technology, flexible configuration, and broad range of applications, it delivers a comprehensive suite of measurement solutions.

Keywords: [New Product Launch] The Chongguang Ultra-Low-Temperature Displacement Probe Station Has Been Successfully Developed!

Products suitable for this type of application

High-Low Temperature Displacement Probe Station

TS600E-OE TS600E-HF GM-10K-OE

The Congtical Technology OE-series probe station is available in two cooling configurations—liquid nitrogen cooling and GM cryocooler—and offers a controllable temperature range from −260°C to 600°C. The system supports DC signals as low as 1 pA, high-frequency signals up to 50 GHz, and high-voltage signals up to 1 kV. Microscopes, probes, and temperature‑controlled modules can be interchanged as needed, and the platform comes with advanced material‑property measurement software that includes optoelectronic and thermoelectric testing capabilities. It is widely used in semiconductor manufacturing, MEMS, superconductivity, electronics, physics, and materials science, enabling standard I–V, C–V, microwave, and optoelectronic experiments.
High compatibility: It is compatible with 1 pA DC signals, 50 Hz high-frequency signals, and 1 kV high-voltage signals.
Multifunctional integration: microscope, probe, temperature‑controlled module, and an expandable materials‑properties measurement software suite, supporting optoelectronic, thermal, and other testing capabilities.
Micro‑vibration environment: Employing a suspended isolation design, the sample stage exhibits vibrations of less than 100 nm.

View Details >

Cryogenic Optical Platform

GM-10K-SM, GM-6K-SM

This model of cryogenic stage features a suspended vibration-isolation design, with sample‑stage vibrations kept below 100 nm. Its compact footprint facilitates seamless integration with microscopes, Raman spectrometers, and other instruments. A wide range of accessories is available, including low‑temperature piezoelectric stages, optical components, electrical connectors, and windows made from various materials, enabling versatile configurations. It is well suited for applications across the semiconductor industry, MEMS, superconductivity, electronics, printed electronics, physics, and materials science.

View Details >