Vacuum pA‑level current, four‑probe method, temperature‑controlled stage, on‑site testing

Release date: 2024-02-13

Summary: Recently, in response to customer requirements, test engineers conducted microscope‑compatible and temperature‑control tests on a picoampere‑level current 4‑probe stage with thermal cycling capability.

Recently, in response to customer requirements, test engineers conducted microscope‑compatibility and temperature‑control tests on a picoampere‑level current four‑probe thermal stage.

I. Product Overview

The Congtical Technology Pi’an‑grade Current‑4‑Probe Temperature‑Controlled Stage is a product specifically designed for variable‑temperature electrical measurements in materials research. It enables characterization of materials during both heating and cooling cycles, allowing measurement of temperature‑dependent resistance and the evolution of electrical properties with temperature.

This model achieves high-precision XYZ‑axis displacement by adjusting the external probe arm to reposition the internal probe. Additionally, it features 24 internal electrode leads, facilitating connection to a variety of source meters for conducting diverse electrical measurements, such as dielectric constant, ferroelectric constant, I‑V characteristics, and temperature‑dependent resistance.

II. Product Specifications

Project	Technical Specifications
Hot and cold methods	Liquid nitrogen cooling, resistive heating
Temperature range	-190~500℃
Temperature stability	±0.1℃
Temperature resolution	0.1℃
Current accuracy	1pA
Displacement accuracy	4-axis DC XYZ positioning accuracy: ±0.01 mm; XYZ travel range: ±6.5 mm.
Vacuum level	≤0.1 Pa (including mechanical pump and vacuum gauge)
Probe	4 sets of coaxial probes, vacuum‑compatible triaxial SMA connectors
Stage size	31×30 mm square stage
Stage material	Silver-plated