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Describe:The High-Low Temperature Thermoelectric Parameter Testing System (TMS) is a professional tool for thermoelectric material research. It measures the Seebeck coefficient and electrical resistivity of metals/semiconductors under high-low temperatures, supporting bulk, filamentary, and thin-film samples (thickness ≥50nm).
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1.Product Introduction
The High-Low Temperature Thermoelectric Parameter Testing System (TMS) is a professional tool for thermoelectric material research. It measures the Seebeck coefficient and electrical resistivity of metals/semiconductors under high-low temperatures, supporting bulk, filamentary, and thin-film samples (thickness ≥50nm).
2.Product Features
Advanced Dynamic Measurement Technology: Ensures accurate and reliable test data.
3.Product Parameters


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