Holzer effect tester(HEM)

Describe：HEM can be used for measuring the Hall coefficient, resistivity, electron mobility, and carrier concentration of general semiconductor materials at room temperature, and is an important tool for studying the electronic properties of semiconductors and electronic materials.

Model：HEM
Manufacturer：Congtical
Update time：2023-6-14
Visits：1779

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Product Category

Thermal analyzer

(MMS)Variable temperature microscope measurement system (OMS)Variable temperature optical fiber spectrum measurement system (RMS)Variable temperature resistivity measurement system (SMS)Variable temperature tensile measurement system (DMS)Dielectric temperature spectrum measurement system (HEM)Hall effect tester (TPA)Thermoelectric performance analyzer (TEAM)Device quality inspection instrument

Articles

Introduce

1.Product introduction

HEM can be used for measuring the Hall coefficient, resistivity, electron mobility, and carrier concentration of general semiconductor materials at room temperature, and is an important tool for studying the electronic properties of semiconductors and electronic materials.

2.Product features

(1) A high-precision current source with an output accuracy of up to 0.1 microamperes, capable of measuring most semiconductor materials.

(2) High precision voltage source, 24 bit ADC acquisition, accuracy up to microvolt level.

(3) Reliable repeatability, multiple filtering of software and hardware design, making the measurement data more stable, ensuring that each experimental number is the average of multiple tests.

(4) Simple and atmospheric appearance design, simple instrument connection and operation. After setting sample information, users can click to test with one click the resistivity, carrier concentration, Hall coefficient, and square resistance data can be obtained simultaneously.

(5) Fast testing speed, supporting fast switching of current and magnetic field directions, and data processing through Vanderberg method.

3.Product appearance

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