【New Product Launch 】Ultra-low Temperature Displacement Probe Station Successfully Developed!

The high-low temperature displacement probe station, shouldering the mission of technological innovation, emerges as the times require. With GM refrigeration mechanism technology at its core, it constructs a full-temperature-range measurement and control platform from 6K ultra-low temperature to 320K, paired with a multi-modal signal compatible system and modular measurement architecture, providing disruptive solutions for material characterization and device testing in extreme environments.

Advanced Refrigeration Technology Covering Ultra-wide Temperature Range

The high-low temperature displacement probe station adopts an advanced GM refrigeration mechanism, enabling controllable temperature within the ultra-wide range from 6K to 302K. 

Whether in ultra-low temperature environments close to absolute zero or scenarios above room temperature, it operates stably, providing precise temperature control for your experiments. This feature meets the physical property measurement needs of different materials under extreme temperatures, excelling in both critical temperature research of superconducting materials and performance testing of high-temperature semiconductor devices.

Technical Parameter Table of Ultra - Low Temperature Displacement Probe Station

Model	GM - 6K - OE
Refrigeration Method	GM Refrigerator
Temperature Range	6K - 320K
Display Precision	0.001K
Temperature Control Precision	±0.01K
Maximum Heating Rate	20K/min
Maximum Cooling Rate	10K/2h
Sample Stage Size	Φ40mm
Front Observation Window Size	Φ41mm (Single - side)
External Dimensions	4504501000mm
Net Weight of Cavity	90kg
Probe Type	DC or High - Frequency Displacement Probe
Adjustment Method	Displacement Knob Adjustment
Probe Material	Tungsten steel or beryllium copper (Probe tip 1μm); or 50g high - frequency probe or DC probe
Number of Probes	4 or 6
Current Parameter	pA Level

Superb Signal Compatibility for Complex Measurements

In signal measurement, the probe station performs equally remarkably. It is compatible with DC signals as low as 1pA, 50GHz high-frequency signals, and 1kV high-voltage signals, enabling precise measurement of multiple signal types on the same device. This eliminates the need for frequent equipment replacement, significantly improving experimental efficiency and reducing equipment costs. Whether detecting weak current signals, analyzing high-frequency microwave signals, or testing electrical properties under high voltage, it captures signal details accurately, providing reliable data support.

Flexible Module Switching to Expand Measurement Possibilities

Modules such as microscopes, probes, and temperature controllers can be switched independently according to experimental needs, allowing more flexible and diverse experimental designs. The device is equipped with extended physical property measurement software integrating photoelectric, thermal, and other testing functions. Through simple operations, you can easily switch between different test items to complete comprehensive measurements from electrical to optical and thermal characteristics. The user-friendly and powerful software supports real-time data collection, processing, and analysis, providing strong software support for scientific research.

Wide Application Fields to Boost Multi-industry Development

• In semiconductor industry: For standard IV/CV testing to evaluate semiconductor device performance.
• In MEMS field: For precise displacement and mechanical property measurement of micro-electromechanical systems.
• In superconducting research: Providing key data for performance characterization of superconducting materials.

• In electronics, physics, materials science: Enabling microwave, optoelectronic, and other experiments to assist researchers in exploring unknown scientific frontiers.

Choose High-Low Temperature Displacement Probe Station to Start a New Journey of Precise Measurement